This webinar presents a new process that makes characterization and parameter extraction easier and quicker. We'll be discussing the extraction of common parameters as well as which tests to run to get the most information about your device.
Register today and learn how to:
• Characterize both AC and DC properties of a MOS device
• Perfom I-V and C-V measurements correctly the first time
• Switch between DC and AC measurements quickly and easily
Длительность 27m 27s
